X-ray microscope (XRM) Zeiss Xradia 520 Versa
The X-ray microscope (XRM) Xradia 520 Versa from Zeiss enables non-destructive X-ray imaging (computed tomography, CT) of samples made of plastics, metals, and ceramics. By processing tomographic images, for example, precipitation distributions in casting alloys, pore volumes in additively manufactured samples, or deformation-related defects such as cracks measuring one or a few micrometers in size can be measured and represented in three dimensions.
The X-ray microscope (XRM) Xradia 520 Versa from Zeiss enables non-destructive X-ray imaging (computed tomography, CT) of samples made of plastics, metals, and ceramics. By processing tomographic images, for example, precipitation distributions in casting alloys, pore volumes in additively manufactured samples, or deformation-related defects such as cracks measuring one or a few micrometers in size can be measured and represented in three dimensions.
Technical equipment
- Resolution up to 900 nm
- X-ray source with 30-160 kV (suitable for high-density materials such as steels)
- Various objectives for different magnifications (0.4x, 4x and 20x)
- FPX flat panel for short measurement times on large samples
- Diffraction contrast tomography for crystallographic analyses of grain size orientation (LabDCT)
- In-Situ-Modul für Zug- und Druckversuche inklusive Probentemperierung von 20 °C bis 160 °C (Deben CT5000-Tec)
- Correlative workflow in combination with the Zeiss Auriga dual-beam system
30823 Garbsen
