The Institute of Materials Science opertaes a large-chamber scanning electron microscope at its disposal, with which even large components can be analysed under an electron microscope without having to separate relevant areas from the component. This is particularly advantageous when analysing fractures, as there is no need for separate sample preparation. The beam generation and the detectors for recording the measurement signals correspond to those in conventional electron microscopes, which ensures a comparable analysis quality.
The Institute of Materials Science opertaes a large-chamber scanning electron microscope at its disposal, with which even large components can be analysed under an electron microscope without having to separate relevant areas from the component. This is particularly advantageous when analysing fractures, as there is no need for separate sample preparation. The beam generation and the detectors for recording the measurement signals correspond to those in conventional electron microscopes, which ensures a comparable analysis quality.
Last Change: 25.03.24
